This paper addresses the problem of generating symbolic test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of rea...
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
Information retrieval (IR) researchers commonly use three tests of statistical significance: the Student's paired t-test, the Wilcoxon signed rank test, and the sign test. Ot...
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-...