Sciweavers

21183 search results - page 169 / 4237
» Adaptive Testing by Test
Sort
View
TACAS
2005
Springer
120views Algorithms» more  TACAS 2005»
15 years 10 months ago
Symbolic Test Selection Based on Approximate Analysis
This paper addresses the problem of generating symbolic test cases for testing the conformance of a black-box implementation with respect to a specification, in the context of rea...
Bertrand Jeannet, Thierry Jéron, Vlad Rusu,...
SBCCI
2004
ACM
117views VLSI» more  SBCCI 2004»
15 years 10 months ago
Reducing test time with processor reuse in network-on-chip based systems
This paper proposes a test planning method capable of reusing available processors as test sources and sinks, and the on-chip network as the access mechanism for the test of cores...
Alexandre M. Amory, Érika F. Cota, Marcelo ...
VTS
2000
IEEE
95views Hardware» more  VTS 2000»
15 years 9 months ago
DEFUSE: A Deterministic Functional Self-Test Methodology for Processors
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
Li Chen, Sujit Dey
CIKM
2007
Springer
15 years 8 months ago
A comparison of statistical significance tests for information retrieval evaluation
Information retrieval (IR) researchers commonly use three tests of statistical significance: the Student's paired t-test, the Wilcoxon signed rank test, and the sign test. Ot...
Mark D. Smucker, James Allan, Ben Carterette
ESEM
2009
ACM
15 years 8 months ago
Test coverage and post-verification defects: A multiple case study
Test coverage is a promising measure of test effectiveness and development organizations are interested in costeffective levels of coverage that provide sufficient fault removal w...
Audris Mockus, Nachiappan Nagappan, Trung T. Dinh-...