1 The low throughput at IC (Integrated Circuit) testing is mainly due to the increasing test data volume, which leads to high ATE (Automatic Test Equipment) memory requirements and...
This paper proposes progressive group testing techniques to test large number of Web services (WS) available on Internet. At the unit testing level, the WS with the same functional...
HOL-TestGen is a specification and test case generation environment extending the interactive theorem prover Isabelle/HOL. The HOL-TestGen method is two-staged: first, the origina...
: Testing the correctness of services assures the functional quality of service-oriented application. A service-oriented application may bind dynamically to its supportive services...
– In this paper, we present an open architecture Virtual Test Environment (VTE) which can be easily integrated into various modularized Automatic Test Systems (ATS) compliant to ...