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128
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DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
Abstract—Wafer-level test during burn-in (WLTBI) has recently emerged as a promising technique to reduce test and burn-in costs in semiconductor manufacturing. However, the testi...
122
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QSIC
2008
IEEE
15 years 10 months ago
2008
IEEE
In the context of open source development or software evolution, developers are often faced with test suites which have been developed with no apparent rationale and which may nee...
125
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ISSRE
2005
IEEE
15 years 9 months ago
2005
IEEE
A classic question in software development is “H ow much testing is enough?” Aside from dynamic coverage-based metrics, there are few measures that can be used to provide guid...
138
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DATE
2002
IEEE
15 years 8 months ago
2002
IEEE
Production test costs for today’s RF circuits are rapidly escalating. Two factors are responsible for this cost escalation: (a) the high cost of RF ATEs and (b) long test times ...
130
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SC
1994
ACM
15 years 8 months ago
1994
ACM
Most current data dependence tests cannot handle loop bounds or array subscripts that are symbolic, nonlinear expressions e.g. Ani+j, where 0 j n. In this paper, we describe a d...