21183 search results - page 65 / 4237 » Adaptive Testing by Test |
162
Voted
ICST
2009
IEEE
15 years 10 months ago
2009
IEEE
It is challenging to test applications and functions for which the correct output for arbitrary input cannot be known in advance, e.g. some computational science or machine learni...
103
Voted
DATE
2008
IEEE
15 years 10 months ago
2008
IEEE
CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any ...
146
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KDD
2000
ACM
15 years 7 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
130
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WCE
2007
15 years 5 months ago
2007
This paper deals with the identification of best and optimized test cases in program components and software artifacts. Our purpose is to simulate the model on a sample software pr...
116
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ISSRE
2008
IEEE
15 years 10 months ago
2008
IEEE
The usual way to compare testing strategies, whether theoretically or empirically, is to compare the number of faults they detect. To ascertain definitely that a testing strategy...