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2008
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CASP: Concurrent Autonomous Chip Self-Test Using Stored Test Patterns
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CASP, Concurrent Autonomous chip self-test using Stored test Patterns, is a special kind of self-test where a system tests itself concurrently during normal operation without any downtime visible to the end-user. CASP consists of two ideas:
Yanjing Li, Samy Makar, Subhasish Mitra
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Autonomous Chip Self-test
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CASP
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DATE 2008
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Hardware
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Stored Test Patterns
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Added
29 May 2010
Updated
29 May 2010
Type
Conference
Year
2008
Where
DATE
Authors
Yanjing Li, Samy Makar, Subhasish Mitra
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Hardware Study Group
Computer Vision