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search results - page 77 / 4237
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Adaptive Testing by Test
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TAICPART
2006
IEEE
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Improving Testing Efficiency using Cumulative Test Analysis
15 years 10 months ago
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Ian Holden, Dave Dalton
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ASPDAC
2006
ACM
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FCSCAN: an efficient multiscan-based test compression technique for test cost reduction
15 years 10 months ago
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Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Ya...
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DATE
2003
IEEE
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DATE 2003
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A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization
15 years 9 months ago
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Vikram Iyengar, Anshuman Chandra, Sharon Schweizer...
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FTDCS
2003
IEEE
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Distributed And Parallel Com...
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Scenario-Based Object-Oriented Test Frameworks for Testing Distributed Systems
15 years 9 months ago
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asusrl.eas.asu.edu
Wei-Tek Tsai, Lian Yu, Akihiro Saimi
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ISCAS
2003
IEEE
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ISCAS 2003
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Systematic test program generation for SoC testing using embedded processor
15 years 9 months ago
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www.utdallas.edu
Mohammad H. Tehranipour, Mehrdad Nourani, Seid Meh...
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