Sciweavers

21183 search results - page 77 / 4237
» Adaptive Testing by Test
Sort
View
ASPDAC
2006
ACM
83views Hardware» more  ASPDAC 2006»
15 years 10 months ago
FCSCAN: an efficient multiscan-based test compression technique for test cost reduction
Youhua Shi, Nozomu Togawa, Shinji Kimura, Masao Ya...
DATE
2003
IEEE
76views Hardware» more  DATE 2003»
15 years 9 months ago
A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization
Vikram Iyengar, Anshuman Chandra, Sharon Schweizer...
ISCAS
2003
IEEE
89views Hardware» more  ISCAS 2003»
15 years 9 months ago
Systematic test program generation for SoC testing using embedded processor
Mohammad H. Tehranipour, Mehrdad Nourani, Seid Meh...