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DATE
2003
IEEE

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A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization

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A Unified Approach for SOC Testing Using Test Data Compression and TAM Optimization

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Vikram Iyengar, Anshuman Chandra, Sharon Schweizer

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Added	04 Jul 2010
Updated	04 Jul 2010
Type	Conference
Year	2003
Where	DATE
Authors	Vikram Iyengar, Anshuman Chandra, Sharon Schweizer, Krishnendu Chakrabarty

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