A dynamic binary translation system for a co-designed virtual machine is described and evaluated. The underlying hardware directly executes an accumulator-oriented instruction set...
Abstract—Continuously reducing transistor sizes and aggressive low power operating modes employed by modern architectures tend to increase transient error rates. Concurrently, mu...
Isil Oz, Haluk Rahmi Topcuoglu, Mahmut T. Kandemir...
Extensive work has been done for optimal management of scratch-pad memory (SPM) all assuming that the SPM is assigned a fixed address space. The main target objects to be placed o...
Device scaling trends dramatically increase the susceptibility of microprocessors to soft errors. Further, mounting demand for embedded microprocessors in a wide array of safety c...
Jason A. Blome, Shantanu Gupta, Shuguang Feng, Sco...
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...