2259 search results - page 48 / 452 » Addressing Mode Selection |
GECCO
2004
Springer
14 years 2 months ago
2004
Springer
The use of Genetic Algorithms in evolution of mutants and test cases offers new possibilities in addressing some of the main problems of mutation testing. Most specifically the p...
AIRS
2008
Springer
13 years 11 months ago
2008
Springer
Although regarded as one of the most successful algorithm to identify predictive features, Relief is quite vulnerable to outliers and noisy features. The recently proposed I-Relief...
SDM
2007
SIAM
13 years 10 months ago
2007
SIAM
Feature selection is an important task in effective data mining. A new challenge to feature selection is the so-called “small labeled-sample problem” in which labeled data is...
DATE
2005
IEEE
14 years 2 months ago
2005
IEEE
Power dissipation during test is a major challenge in testing integrated circuits. Dynamic power has been the dominant part of power dissipation in CMOS circuits, however, in futu...
ISCAS
2005
IEEE
14 years 2 months ago
2005
IEEE
Abstract— This paper describes the fast-scale bifurcation phenomena of a single-stage power-factor-correction (PFC) power supply which is commonly used in low power applications....