1728 search results - page 62 / 346 » Advanced empirical testing |
VTS
2002
IEEE
14 years 2 months ago
2002
IEEE
A device testing method called Transient Signal Analysis (TSA) is subjected to elements of a real process and testing environment in this paper. Simulations experiments are design...
ICCAD
1998
IEEE
14 years 2 months ago
1998
IEEE
This paper presents two new algorithms, Redundant Vector Elimination(RVE) and Essential Fault Reduction (EFR), for generating compact test sets for combinational circuits under th...
ERLANG
2004
ACM
14 years 3 months ago
2004
ACM
Testing of software components during development is a heavily used approach to detect programming errors and to evaluate the quality of software. Systematic approaches to softwar...
ICALT
2003
IEEE
14 years 3 months ago
2003
IEEE
Since the approval of IEEE LOM Draft Standard and the advance of network-driven learning technology, a large number of resource database constructors, content developers and learn...
DEBU
2008
13 years 10 months ago
2008
Query optimization is an inherently complex problem, and validating the correctness and effectiveness of a query optimizer can be a task of comparable complexity. The overall proc...