For emerging deep-subwavelength lithography technologies (90 nm and following) the data volume and the complexity of Optical Proximity Correction (OPC) have increased dramatically...
We address failure location and restoration in both optical and wireless ad hoc networks. First, we show how Maximum Likelihood inference can improve failure location algorithms in...
Frederick Ducatelle, Luca Maria Gambardella, Macie...
We present an interactive technique for the registration of captured images of elastic and rigid body parts in which the user is given flexible control over material specific de...
Abstract--Due to the limited depth of field of brightfield microscopes, it is usually impossible to image thick specimens entirely in focus. By optically sectioning the specimen, t...
We introduce tailored displays that enhance visual acuity by decomposing virtual objects and placing the resulting anisotropic pieces into the subject’s focal range. The goal is...
Vitor F. Pamplona, Manuel M. Oliveira, Daniel G. A...