5699 search results - page 1135 / 1140 » Alternating model trees |
CCCG
2010
13 years 7 months ago
2010
Various notions of coverage provided by wireless sensor networks have attracted considerable attention over the past few years. In general, coverage can be expressed geometrically...
CIKM
2010
Springer
13 years 7 months ago
2010
Springer
Schema merging is the process of consolidating multiple schemas into a unified view. The task becomes particularly challenging when the schemas are highly heterogeneous and autono...
ICDM
2010
IEEE
13 years 7 months ago
2010
IEEE
Consider a typical recommendation problem. A company has historical records of products sold to a large customer base. These records may be compactly represented as a sparse custom...
CIKM
2009
Springer
13 years 7 months ago
2009
Springer
Standard approaches to evaluating and comparing information retrieval systems compute simple averages of performance statistics across individual topics to measure the overall sys...
ICCAD
2009
IEEE
13 years 7 months ago
2009
IEEE
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...