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» Alternative Test Methods Using IEEE 1149.4
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DATE
2000
IEEE
130views Hardware» more  DATE 2000»
14 years 2 months ago
Optimal Hardware Pattern Generation for Functional BIST
∗∗ Functional BIST is a promising solution for self-testing complex digital systems at reduced costs in terms of area and performance degradation. The present paper addresses t...
Silvia Cataldo, Silvia Chiusano, Paolo Prinetto, H...
ICCV
2003
IEEE
14 years 11 months ago
Controlling Model Complexity in Flow Estimation
This paper describes a novel application of Statistical Learning Theory (SLT) to control model complexity in flow estimation. SLT provides analytical generalization bounds suitabl...
Zoran Duric, Fayin Li, Harry Wechsler, Vladimir Ch...
ICML
2007
IEEE
14 years 10 months ago
Large-scale RLSC learning without agony
The advances in kernel-based learning necessitate the study on solving a large-scale non-sparse positive definite linear system. To provide a deterministic approach, recent resear...
Wenye Li, Kin-Hong Lee, Kwong-Sak Leung
ICML
2001
IEEE
14 years 10 months ago
Feature selection for high-dimensional genomic microarray data
We report on the successful application of feature selection methods to a classification problem in molecular biology involving only 72 data points in a 7130 dimensional space. Ou...
Eric P. Xing, Michael I. Jordan, Richard M. Karp
ECBS
1997
IEEE
103views Hardware» more  ECBS 1997»
14 years 1 months ago
The Advanced Battlefield Architecture for Tactical Information Selection (ABATIS)
Modern warfare requires the understanding and management of increasingly complex assemblages of resources. The Advanced Battlefield Architecture for TacticalInformation Selection ...
J. S. Keane, Jerzy W. Rozenblit, Michael Barnes