2451 search results - page 22 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
: This paper addresses the challenges imposed on current testing with the advent of Nanotechnologies. It shows why existing measurement solutions embedded in ATE systems are not ad...
ITC
2003
IEEE
14 years 28 days ago
2003
IEEE
As the performance of Analog-to-Digital Converters continues to improve, it is becoming more challenging and costly to develop sufficiently fast and low-drift signal generators th...
ASWEC
2007
IEEE
13 years 11 months ago
2007
IEEE
Testers often represent systems under test in input parameter models. These contain parameters with associated values. Combinations of parameter values, with one value for each pa...
ICSEA
2007
IEEE
14 years 1 months ago
2007
IEEE
Abstract—Nondeterminism is used as a means of underspecification or implementation choice in specifications, and it is often necessary if part of a system or the environment is...
KBSE
2007
IEEE
14 years 1 months ago
2007
IEEE
Automating the generation of object-oriented unit tests is a challenging task. This is mainly due to the complexity and peculiarities that the principles of object-orientation imp...