2451 search results - page 27 / 491 » Alternative Test Methods Using IEEE 1149.4 |
DSD
2010
IEEE
13 years 6 months ago
2010
IEEE
— In this paper we propose a new method of test patterns compression based on a design of a dedicated SAT-based ATPG (Automatic Test Pattern Generator). This compression method i...
DATE
2003
IEEE
14 years 29 days ago
2003
IEEE
: Stresses are considered an integral part of any modern industrial DRAM test. This paper describes a novel method to optimize stresses for memory testing, using defect injection a...
ICPR
2004
IEEE
14 years 8 months ago
2004
IEEE
We propose a hybrid face recognition method that combines holistic and feature analysis-based approaches using a Markov random field (MRF) model. The face images are divided into ...
WACV
2005
IEEE
14 years 1 months ago
2005
IEEE
In this paper we describe a novel method for gait based identity verification based on Bayesian classification. The verification task is reduced to a two class problem (Client or ...
ICPR
2002
IEEE
14 years 18 days ago
2002
IEEE
Testing for uniformity of multivariate data is the initial step in exploratory pattern analysis. We propose a new uniformity testing method, which first computes the maximum (sta...