2451 search results - page 29 / 491 » Alternative Test Methods Using IEEE 1149.4 |
CORR
2011
Springer
13 years 2 months ago
2011
Springer
—This paper studies the problem of high-dimensional multiple testing and sparse recovery from the perspective of sequential analysis. In this setting, the probability of error is...
ATS
2010
IEEE
13 years 5 months ago
2010
IEEE
In the conventional ADC production test method, a high-quality analogue sine wave is applied to the Analogue-toDigital Converter (ADC), which is expensive to generate. Nowadays, an...
ICML
2004
IEEE
14 years 8 months ago
2004
IEEE
We introduce a framework, which we call Divide-by-2 (DB2), for extending support vector machines (SVM) to multi-class problems. DB2 offers an alternative to the standard one-again...
MTDT
1999
IEEE
13 years 12 months ago
1999
IEEE
This paper presents characterization methods for an SDRAM in a manufacturing environment. Contact tests, dc tests, basic functional tests, signal margin tests and retention charac...
ICDM
2002
IEEE
14 years 18 days ago
2002
IEEE
Segmentation is a popular technique for discovering structure in time series data. We address the largely open problem of estimating the number of segments that can be reliably di...