2451 search results - page 30 / 491 » Alternative Test Methods Using IEEE 1149.4 |
ICECCS
2000
IEEE
13 years 11 months ago
2000
IEEE
This paper compares three specification-based testing criteria using Mathur and Wong's PROBSUBSUMES measure. The three criteria are specification-mutation coverage, full pred...
ATS
2005
IEEE
14 years 1 months ago
2005
IEEE
Power reduction during test application is important from the viewpoint of chip reliability and for obtaining correct test results. One of the ways to reduce scan test power is to...
COMPSAC
2002
IEEE
14 years 19 days ago
2002
IEEE
One of the most important issues in the software development is how to guarantee that the software satisfies the quality defined in the requirement specification. This paper pr...
DEXAW
2007
IEEE
14 years 2 months ago
2007
IEEE
Several classical schemes exist to represent trees as strings over a fixed alphabet; these are useful in many algorithmic and conceptual studies. Our previous work has proposed a...
ITC
2003
IEEE
14 years 28 days ago
2003
IEEE
Current-based tests are the most effective methods available to detect resistive shorts. Delta IDDQ testing is the most sensitive variant and can handle off-state currents of 10-1...