2451 search results - page 36 / 491 » Alternative Test Methods Using IEEE 1149.4 |
CSMR
2003
IEEE
14 years 1 months ago
2003
IEEE
Testing a distributed system is difficult. Good testing depends on both skill and understanding the system under test. We have developed a method to observe the system at the CORB...
DFT
2002
IEEE
14 years 19 days ago
2002
IEEE
This paper describes a new compression/decompression methodology for using an embedded processor to test the other components of a system-on-a-chip (SoC). The deterministic test v...
ICCAD
1996
IEEE
13 years 12 months ago
1996
IEEE
In this paper, we propose a method to generate high quality test waveform on chip to avoid the parasitic eects in an analog testability bus test environment. For the test response...
KBSE
2007
IEEE
14 years 2 months ago
2007
IEEE
Concurrent programs are difficult to debug and verify because of the nondeterministic nature of concurrent executions. A particular concurrency-related bug may only show up under ...
ISMVL
2006
IEEE
14 years 1 months ago
2006
IEEE
Multiple-valued logic can be viewed as an alternative approach to solving many problems in transmission, storage, and processing of large and even increasing amounts of informatio...