2451 search results - page 3 / 491 » Alternative Test Methods Using IEEE 1149.4 |
DFT
2009
IEEE
14 years 2 months ago
2009
IEEE
Recently, a new test point insertion method for pseudo-random built-in self-test (BIST) was proposed in [Yang 09] which tries to use functional flip-flops to drive control test po...
DATE
2005
IEEE
14 years 1 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
SIBGRAPI
1999
IEEE
13 years 12 months ago
1999
IEEE
Many scientific applications use scattered data originated from samples. Interpolation techniques are necessary to estimate the values on non-sampled regions. In a previous work, t...
ETS
2006
IEEE
14 years 1 months ago
2006
IEEE
Spectral analysis represents a key component in signal processing. The on-chip implementation of classical spectral estimation techniques is generally not considered as a viable B...
ICITA
2005
IEEE
14 years 1 months ago
2005
IEEE
In the next generation Internet, the network should not only be considered as a communication medium, but also as an endless source of services available to the end-systems. These...