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» Alternative Test Methods Using IEEE 1149.4
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IFM
2005
Springer
14 years 1 months ago
Generating Path Conditions for Timed Systems
We provide an automatic method for calculating the path condition for programs with real time constraints. This method can be used for the semiautomatic verification of a unit of ...
Saddek Bensalem, Doron Peled, Hongyang Qu, Stavros...
WWW
2009
ACM
14 years 2 months ago
Bootstrapped extraction of class attributes
As an alternative to previous studies on extracting class attributes from unstructured text, which consider either Web documents or query logs as the source of textual data, A boo...
Joseph Reisinger, Marius Pasca
BMVC
1997
13 years 9 months ago
Further Five Point Fit Ellipse Fitting
The least squares method is the most commonly used technique for fitting an ellipse through a set of points. However, it has a low breakdown point, which means that it performs p...
Paul L. Rosin
AAAI
2007
13 years 10 months ago
A Kernel Approach to Comparing Distributions
We describe a technique for comparing distributions without the need for density estimation as an intermediate step. Our approach relies on mapping the distributions into a Reprod...
Arthur Gretton, Karsten M. Borgwardt, Malte J. Ras...
DATE
2005
IEEE
104views Hardware» more  DATE 2005»
14 years 1 months ago
Defect Aware Test Patterns
A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The propose...
Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen W...