Defect Aware Test Patterns

A method to generate test patterns referred to as defect aware test patterns is proposed. Defect aware test patterns have greater ability to detect un-modeled defects. The proposed method can be used with any test generation procedure to improve the effectiveness of the tests in detecting un-modeled defects. Experimental results on several industrial designs show the effectiveness of defect aware tests. We also propose a measure to estimate the effectiveness of given test sets in detecting un-modeled defects.

• Type: Conference
• Year: 2005
• Where: DATE
• Authors: Huaxing Tang, Gang Chen, Sudhakar M. Reddy, Chen Wang, Janusz Rajski, Irith Pomeranz
• Keywords: Aware Test Patterns, DATE 2005, Defect Aware Tests, Hardware, Un-modeled Defects