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» Alternative Test Methods Using IEEE 1149.4
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ASYNC
2006
IEEE
92views Hardware» more  ASYNC 2006»
14 years 1 months ago
Low-Overhead Testing of Delay Faults in High-Speed Asynchronous Pipelines
We propose a low-overhead method for delay fault testing in high-speed asynchronous pipelines. The key features of our work are: (i) testing strategies can be administered using l...
Gennette Gill, Ankur Agiwal, Montek Singh, Feng Sh...
ICST
2009
IEEE
14 years 2 months ago
On the Effectiveness of Test Extraction without Overhead
Developers write and execute ad-hoc tests as they implement software. While these tests reflect important insights of the developers (e.g., which parts of the software need testi...
Andreas Leitner, Alexander Pretschner, Stefan Mori...
ICSM
1993
IEEE
13 years 12 months ago
Incremental Regression Testing
The purpose of regression testing is to ensure that bug xes and new functionality introduced in a new version of a software do not adversely a ect the correct functionality inheri...
Hiralal Agrawal, Joseph Robert Horgan, Edward W. K...
DATE
1999
IEEE
73views Hardware» more  DATE 1999»
14 years 2 days ago
Design For Testability Method for CML Digital Circuits
This paper presents a new Design for Testability (DFT) technique for Current-Mode Logic (CML) circuits. This new technique, with little overhead, using built-in detectors, monitor...
Bernard Antaki, Yvon Savaria, Nanhan Xiong, Saman ...
BIOINFORMATICS
2007
190views more  BIOINFORMATICS 2007»
13 years 7 months ago
Towards clustering of incomplete microarray data without the use of imputation
Motivation: Clustering technique is used to find groups of genes that show similar expression patterns under multiple experimental conditions. Nonetheless, the results obtained by...
Dae-Won Kim, Ki Young Lee, Kwang H. Lee, Doheon Le...