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» Alternative Test Methods Using IEEE 1149.4
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DATE
2009
IEEE
106views Hardware» more  DATE 2009»
15 years 9 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
123
Voted
ICST
2008
IEEE
15 years 8 months ago
Designing and Building a Software Test Organization
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
Bruce Benton
ICCAD
1996
IEEE
103views Hardware» more  ICCAD 1996»
15 years 6 months ago
Metrics, techniques and recent developments in mixed-signal testing
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. ...
Gordon W. Roberts
103
Voted
CDC
2008
IEEE
131views Control Systems» more  CDC 2008»
15 years 9 months ago
Probabilistic testing for stochastic hybrid systems
— In this paper we propose a testing based method for safety/ reachability analysis of stochastic hybrid systems. Testing based methods are characterized by analysis based on the...
A. Agung Julius, George J. Pappas
136
Voted
ICIP
2010
IEEE
15 years 11 days ago
Image partitioning with kernel mapping and graph cuts
A novel multiregion graph cut image partitioning method combined with kernel mapping is presented. A kernel function transforms implicitly the image data into data of a higher dim...
Mohamed Ben Salah, Amar Mitiche, Ismail Ben Ayed