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» Alternative Test Methods Using IEEE 1149.4
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DATE
2009
IEEE
106views Hardware» more  DATE 2009»
14 years 2 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
ICST
2008
IEEE
14 years 2 months ago
Designing and Building a Software Test Organization
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
Bruce Benton
ICCAD
1996
IEEE
103views Hardware» more  ICCAD 1996»
13 years 12 months ago
Metrics, techniques and recent developments in mixed-signal testing
This paper presents a tutorial on mixed-signal testing. Our focus is on testing the analog portion of the mixed-signal device, as the digital portion is handled in the usual way. ...
Gordon W. Roberts
CDC
2008
IEEE
131views Control Systems» more  CDC 2008»
14 years 2 months ago
Probabilistic testing for stochastic hybrid systems
— In this paper we propose a testing based method for safety/ reachability analysis of stochastic hybrid systems. Testing based methods are characterized by analysis based on the...
A. Agung Julius, George J. Pappas
ICIP
2010
IEEE
13 years 5 months ago
Image partitioning with kernel mapping and graph cuts
A novel multiregion graph cut image partitioning method combined with kernel mapping is presented. A kernel function transforms implicitly the image data into data of a higher dim...
Mohamed Ben Salah, Amar Mitiche, Ismail Ben Ayed