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» Alternative Test Methods Using IEEE 1149.4
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ICST
2010
IEEE
13 years 6 months ago
Timed Moore Automata: Test Data Generation and Model Checking
Abstract—In this paper we introduce Timed Moore Automata, a specification formalism which is used in industrial train control applications for specifying the real-time behavior ...
Helge Löding, Jan Peleska
COR
2006
64views more  COR 2006»
13 years 7 months ago
Implementing and testing the tabu cycle and conditional probability methods
-- The purpose of this paper is to describe the implementation and testing of the tabu cycle method and two variants of the conditional probability method. These methods were origi...
Manuel Laguna
CORR
2008
Springer
130views Education» more  CORR 2008»
13 years 7 months ago
A Kernel Method for the Two-Sample Problem
We propose two statistical tests to determine if two samples are from different distributions. Our test statistic is in both cases the distance between the means of the two sample...
Arthur Gretton, Karsten M. Borgwardt, Malte J. Ras...
DFT
2004
IEEE
93views VLSI» more  DFT 2004»
13 years 11 months ago
First Level Hold: A Novel Low-Overhead Delay Fault Testing Technique
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
Swarup Bhunia, Hamid Mahmoodi-Meimand, Arijit Rayc...
VLSID
2002
IEEE
95views VLSI» more  VLSID 2002»
14 years 8 months ago
A Novel Method to Improve the Test Efficiency of VLSI Tests
This paper considers reducing the cost of test application by permuting test vectors to improve their defect coverage. Algorithms for test reordering are developed with the goal o...
Hailong Cui, Sharad C. Seth, Shashank K. Mehta