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» Alternative Test Methods Using IEEE 1149.4
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ICCAD
2001
IEEE
84views Hardware» more  ICCAD 2001»
14 years 4 months ago
On Identifying Don't Care Inputs of Test Patterns for Combinational Circuits
Given a test set for stuck-at faults, some of primary input values may be changed to opposite logic values without losing fault coverage. We can regard such input values as don’...
Seiji Kajihara, Kohei Miyase
ISSRE
2003
IEEE
14 years 1 months ago
Augmenting Simulated Annealing to Build Interaction Test Suites
Component based software development is prone to unexpected interaction faults. The goal is to test as many potential interactions as is feasible within time and budget constraint...
Myra B. Cohen, Charles J. Colbourn, Alan C. H. Lin...
ICDE
2007
IEEE
207views Database» more  ICDE 2007»
14 years 9 months ago
SIGOPT: Using Schema to Optimize XML Query Processing
There has been a great deal of work in recent years on processing and optimizing queries against XML data. Typically in these previous works, schema information is not considered,...
Stelios Paparizos, Jignesh M. Patel, H. V. Jagadis...
CSB
2005
IEEE
117views Bioinformatics» more  CSB 2005»
14 years 1 months ago
Protein Structure Prediction Using Physical-Based Global Optimization and Knowledge-Guided Fragment Packing
We describe a new method to predict the tertiary structure of new-fold proteins. Our two-phase approach combines the knowledge-based fragmentpacking with the minimization of a phy...
Jinhui Ding, Elizabeth Eskow, Nelson L. Max, Silvi...
DATE
2009
IEEE
94views Hardware» more  DATE 2009»
14 years 2 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...