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EURODAC
1994
IEEE
148views VHDL» more  EURODAC 1994»
13 years 12 months ago
BiTeS: a BDD based test pattern generator for strong robust path delay faults
This paper presents an algorithm for generation of test patterns for strong robust path delay faults, i.e. tests that propagate the fault along a single path and additionally are ...
Rolf Drechsler
CW
2002
IEEE
14 years 24 days ago
Efficient Data Compression Methods for Multi-Dimensional Sparse Array Operations
For sparse array operations, in general, the sparse arrays are compressed by some data compression schemes in order to obtain better performance. The Compressed Row/Column Storage...
Chun-Yuan Lin, Yeh-Ching Chung, Jen-Shiuh Liu
IDEAS
2005
IEEE
165views Database» more  IDEAS 2005»
14 years 1 months ago
Privacy Aware Data Generation for Testing Database Applications
Testing of database applications is of great importance. A significant issue in database application testing consists in the availability of representative data. In this paper we...
Xintao Wu, Chintan Sanghvi, Yongge Wang, Yuliang Z...
ITC
1997
IEEE
100views Hardware» more  ITC 1997»
14 years 1 days ago
Signal Generation Using Periodic Single-and Multi-Bit Sigma-Delta Modulated Streams
Abstract- This paper describes a new method to generate analog signals with high precision at very low hardware complexity. This method consists in reproducing periodically a recor...
Benoit Dufort, Gordon W. Roberts
APSEC
2004
IEEE
13 years 11 months ago
Testing Java Interrupts and Timed Waits
Testing concurrent software is difficult due to problems with inherent non-determinism. In previous work, we have presented a method and tool support for the testing of concurrent...
Luke Wildman, Brad Long, Paul A. Strooper