2451 search results - page 90 / 491 » Alternative Test Methods Using IEEE 1149.4 |
VTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Timing-related defects are becoming increasingly important in nanometer technology designs. Small delay variations induced by crosstalk, process variations, powersupply noise, as ...
ICCV
2009
IEEE
13 years 5 months ago
2009
IEEE
We describe an energy minimization algorithm for functions defined on 4-connected lattices, of the type usually encountered in problems involving images. Such functions are often ...
ICML
2003
IEEE
14 years 8 months ago
2003
IEEE
In the standard feature selection problem, we are given a fixed set of candidate features for use in a learning problem, and must select a subset that will be used to train a mode...
ISBI
2004
IEEE
14 years 8 months ago
2004
IEEE
In this paper, we present a method for predictive modeling of anatomic structures using canonical correlation analysis (CCA). Using this technique, certain anatomical structures, ...
IROS
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract— We present an adaptive control approach combining forward kinematics model learning methods with the operational space control approach. This combination endows the rob...