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ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
13 years 5 months ago
Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Mohit Gupta, Kwangok Jeong, Andrew B. Kahng
WWW
2009
ACM
14 years 8 months ago
Smart Miner: a new framework for mining large scale web usage data
In this paper, we propose a novel framework called SmartMiner for web usage mining problem which uses link information for producing accurate user sessions and frequent navigation...
Murat Ali Bayir, Ismail Hakki Toroslu, Ahmet Cosar...