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ASPDAC
2004
ACM
126views Hardware» more  ASPDAC 2004»
14 years 26 days ago
High-level area and power-up current estimation considering rich cell library
— Reducing the ever-growing leakage power is critical to power efficient designs. Leakage reduction techniques such as power-gating using sleep transistor insertion introduces la...
Fei Li, Lei He, Joseph M. Basile, Rakesh J. Patel,...
EUROSYS
2006
ACM
14 years 4 months ago
Thorough static analysis of device drivers
Bugs in kernel-level device drivers cause 85% of the system crashes in the Windows XP operating system [44]. One of the sources of these errors is the complexity of the Windows dr...
Thomas Ball, Ella Bounimova, Byron Cook, Vladimir ...
ICST
2008
IEEE
14 years 1 months ago
Designing and Building a Software Test Organization
–Abstract for conference - preliminary Model-Based Testing: Models for Test Cases Jan Tretmans, Embedded Systems Institute, Eindhoven : Systematic testing of software plays an im...
Bruce Benton
CODES
2005
IEEE
14 years 1 months ago
Comparing two testbench methods for hierarchical functional verification of a bluetooth baseband adaptor
The continuous improvement on the design methodologies and processes has made possible the creation of huge and very complex digital systems. Design verification is one of the mai...
Edgar L. Romero, Marius Strum, Wang Jiang Chau
SP
2010
IEEE
194views Security Privacy» more  SP 2010»
13 years 11 months ago
Identifying Dormant Functionality in Malware Programs
—To handle the growing flood of malware, security vendors and analysts rely on tools that automatically identify and analyze malicious code. Current systems for automated malwar...
Paolo Milani Comparetti, Guido Salvaneschi, Engin ...