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» An Approach to Global Sensitivity Analysis: FAST on COCOMO
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DATE
2009
IEEE
125views Hardware» more  DATE 2009»
14 years 2 months ago
On linewidth-based yield analysis for nanometer lithography
— Lithographic variability and its impact on printability is a major concern in today’s semiconductor manufacturing process. To address sub-wavelength printability, a number of...
Aswin Sreedhar, Sandip Kundu
BMCBI
2005
152views more  BMCBI 2005»
13 years 7 months ago
Improved profile HMM performance by assessment of critical algorithmic features in SAM and HMMER
Background: Profile hidden Markov model (HMM) techniques are among the most powerful methods for protein homology detection. Yet, the critical features for successful modelling ar...
Markus Wistrand, Erik L. L. Sonnhammer
BMCBI
2007
102views more  BMCBI 2007»
13 years 7 months ago
A comprehensive system for evaluation of remote sequence similarity detection
Background: Accurate and sensitive performance evaluation is crucial for both effective development of better structure prediction methods based on sequence similarity, and for th...
Yuan Qi, Ruslan Sadreyev, Yong Wang, Bong-Hyun Kim...
ICA
2007
Springer
14 years 1 months ago
Pivot Selection Strategies in Jacobi Joint Block-Diagonalization
A common problem in independent component analysis after prewhitening is to optimize some contrast on the orthogonal or unitary group. A popular approach is to optimize the contras...
Cédric Févotte, Fabian J. Theis
ECCV
2006
Springer
13 years 11 months ago
SIFT and Shape Context for Feature-Based Nonlinear Registration of Thoracic CT Images
Nonlinear image registration is a prerequisite for various medical image analysis applications. Many data acquisition protocols suffer from problems due to breathing motion which h...
Martin Urschler, Joachim Bauer, Hendrik Ditt, Hors...