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DATE
2006
IEEE
14 years 3 months ago
2006
IEEE
same level of system-level CAD support that is now commonplace in the IC industry.Recent advances in microfluidics are expected to lead to sensor systems for high-throughput bioche...
DFT
2006
IEEE
14 years 3 months ago
2006
IEEE
1 High temperature has become a major problem for system-on-chip testing. In order to reduce the test time while keeping the temperature of the chip under test within a safe range,...
GLVLSI
2006
IEEE
14 years 3 months ago
2006
IEEE
Process variations have become a key concern of circuit designers because of their significant, yet hard to predict impact on performance and signal integrity of VLSI circuits. St...
ICRA
2006
IEEE
14 years 3 months ago
2006
IEEE
— In this paper, we consider the problem of exploring an unknown environment with a team of mobile robots. One of the key issues in multi-robot exploration is how to assign targe...
ISSTA
2006
ACM
14 years 3 months ago
2006
ACM
This paper presents a specification-based testing approach that compares software specifications defined at different f abstraction, e.g. architecture and implementation, agai...