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PASTE
2010
ACM
14 years 2 months ago
2010
ACM
Recently there has been significant interest in employing probabilistic techniques for fault localization. Using dynamic dependence information for multiple passing runs, learnin...
VLSID
2010
IEEE
13 years 6 months ago
2010
IEEE
Directed test generation is important for the functional verification of complex system-on-chip designs. SAT based bounded model checking is promising for counterexample generatio...
NDSS
2008
IEEE
14 years 3 months ago
2008
IEEE
Fuzz testing is an effective technique for finding security vulnerabilities in software. Traditionally, fuzz testing tools apply random mutations to well-formed inputs of a progr...
DAC
2006
ACM
13 years 11 months ago
2006
ACM
Software-based self-test (SBST) has recently emerged as an effective methodology for the manufacturing test of processors and other components in systems-on-chip (SoCs). By moving ...
IJIT
2004
13 years 10 months ago
2004
Recent advances in both the testing and verification of software based on formal specifications of the system to be built have reached a point where the ideas can be applied in a p...