482 search results - page 43 / 97 » An Effective Diagnosis Method to Support Yield Improvement |
CSMR
2006
IEEE
13 years 10 months ago
2006
IEEE
The high cost of software maintenance could potentially be greatly reduced by the automatic refactoring of object-oriented programs to increase their understandability, adaptabili...
ACL
2008
13 years 10 months ago
2008
We present a simple and effective semisupervised method for training dependency parsers. We focus on the problem of lexical representation, introducing features that incorporate w...
DATE
2008
IEEE
14 years 3 months ago
2008
IEEE
— In the face of increased process variations, at-speed manufacturing test is necessary to detect subtle delay defects. This procedure necessarily tests chips at a slightly highe...
ICRA
2008
IEEE
14 years 3 months ago
2008
IEEE
— Several recently-designed robots are able to scale steep surfaces using animal-inspired strategies for foot attachment and leg kinematics. These designs could be valuable for r...
FPGA
2010
ACM
14 years 5 months ago
2010
ACM
Deep submicron processes have allowed FPGAs to grow in complexity and speed. However, such technology scaling has caused FPGAs to become more susceptible to the effects of process...