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» An Effective Diagnosis Method to Support Yield Improvement
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DATE
2009
IEEE
94views Hardware» more  DATE 2009»
14 years 2 months ago
Improving compressed test pattern generation for multiple scan chain failure diagnosis
To reduce test data volumes, encoded tests and compacted test responses are widely used in industry. Use of test response compaction negatively impacts fault diagnosis since the e...
Xun Tang, Ruifeng Guo, Wu-Tung Cheng, Sudhakar M. ...
VLSID
2007
IEEE
131views VLSI» more  VLSID 2007»
14 years 7 months ago
Probabilistic Self-Adaptation of Nanoscale CMOS Circuits: Yield Maximization under Increased Intra-Die Variations
As technology scales to 40nm and beyond, intra-die process variability will cause large delay and leakage variations across a chip in addition to expected die-to-die variations. I...
Maryam Ashouei, Muhammad Mudassar Nisar, Abhijit C...
ISQED
2009
IEEE
117views Hardware» more  ISQED 2009»
14 years 2 months ago
Adaptive voltage controlled nanoelectronic addressing for yield, accuracy and resolution
An outstanding challenge for realizing nanoelectronic systems is nano-interface design, i.e., how to precisely access a nanoscale wire in an array for communication between a nano...
Bao Liu
IAT
2006
IEEE
14 years 1 months ago
On the Design of a Web-Based Decision Support System for Brain Tumour Diagnosis Using Distributed Agents
This paper introduces HealthAgents, an EC-funded research project to improve the classification of brain tumours through multi-agent decision support over a distributed network o...
Carles Arús, Bernardo Celda, Srinandan Dasm...
ICAT
2006
IEEE
14 years 1 months ago
Fault Diagnosis System for Turbo-Generator Set Based on Fuzzy Neural Network
When a fault such as unbalance occurs in a turbo-generator set, sensors should be put on its bearing to detect vibration signals for extracting fault symptoms, but the relationshi...
Ping Yang, Qing-miao Wang