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ICDM
2010
IEEE
13 years 6 months ago
2010
IEEE
Graphs are increasingly used to model a variety of loosely structured data such as biological or social networks and entityrelationships. Given this profusion of large-scale graph ...
ICCV
2003
IEEE
14 years 10 months ago
2003
IEEE
This paper addresses the problem of applying powerful pattern recognition algorithms based on kernels to efficient visual tracking. Recently Avidan [1] has shown that object recog...
SSPR
2004
Springer
14 years 2 months ago
2004
Springer
Classification fusion combines multiple classifications of data into a single classification solution of greater accuracy. Feature extraction aims to reduce the computational cost ...
ATS
2009
IEEE
14 years 3 months ago
2009
IEEE
Diagnosis is increasingly important, not only for individual analysis of failing ICs, but also for high-volume test response analysis which enables yield and test improvement. Sca...
DATE
2010
IEEE
14 years 1 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...