6 search results - page 1 / 2 » An Efficient Graph-Based Algorithm for ESD Current Path Anal... |
TCAD
2008
14 years 4 months ago
2008
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
ICCAD
2006
IEEE
15 years 1 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
ESIAT
2009
IEEE
14 years 2 months ago
2009
IEEE
Through analysis of present pseudo-parallel genetic algorithm, propose a new dynamic sub-population pseudo-parallel genetic algorithm. It changes the condition that the magnitude o...
DAC
2004
ACM
15 years 5 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
STOC
2006
ACM
15 years 5 months ago
2006
ACM
We study rerouting policies in a dynamic round-based variant of a well known game theoretic traffic model due to Wardrop. Previous analyses (mostly in the context of selfish routi...