6 search results - page 1 / 2 » An Efficient Graph-Based Algorithm for ESD Current Path Anal... |
TCAD
2008
13 years 10 months ago
2008
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
ICCAD
2006
IEEE
14 years 7 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
ESIAT
2009
IEEE
13 years 8 months ago
2009
IEEE
Through analysis of present pseudo-parallel genetic algorithm, propose a new dynamic sub-population pseudo-parallel genetic algorithm. It changes the condition that the magnitude o...
DAC
2004
ACM
14 years 12 months ago
2004
ACM
Current technology trends have led to the growing impact of both inter-die and intra-die process variations on circuit performance. While it is imperative to model parameter varia...
STOC
2006
ACM
14 years 11 months ago
2006
ACM
We study rerouting policies in a dynamic round-based variant of a well known game theoretic traffic model due to Wardrop. Previous analyses (mostly in the context of selfish routi...