As general-purpose parallel computers are increasingly being used to speed up different VLSI applications, the development of parallel algorithms for circuit testing, logic minimi...
Simulated annealing based standard cell placement for VLSI designs has long been acknowledged as a compute-intensive process. All previous work in parallel simulated annealing bas...
Pad assignment with signal integrity optimization is very important for high-speed VLSI design. In this paper, an efficient method is proposed to effectively minimize both simulta...
Reliability of nanometer circuits is becoming a major concern in today’s VLSI chip design due to interferences from multiple noise sources as well as radiation-induced soft erro...
In this paper an efficient cone oriented circuit partitioning method is presented, which significantly speeds up automatic test pattern generation for combinational circuits. The ...