107 search results - page 10 / 22 » An Experimental Evaluation of Inspection and Testing for Det... |
TSE
2010
13 years 2 months ago
2010
Genetic algorithms (GAs) have been applied previously to UML-driven, stress test requirements generation with the aim of increasing chances of discovering faults relating to networ...
GECCO
2010
Springer
14 years 13 days ago
2010
Springer
The increase in the complexity of modern software has led to the commensurate growth in the size and execution time of the test suites for these programs. In order to address this...
HPCA
2006
IEEE
14 years 8 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...
ECBS
2007
IEEE
14 years 1 months ago
2007
IEEE
Most existing work on t-way testing has focused on 2-way (or pairwise) testing, which aims to detect faults caused by interactions between any two parameters. However, faults can ...
IOLTS
2008
IEEE
14 years 2 months ago
2008
IEEE
Present and future semiconductor technologies are characterized by increasing parameters variations as well as an increasing susceptibility to external disturbances. Transient err...