107 search results - page 13 / 22 » An Experimental Evaluation of Inspection and Testing for Det... |
CHES
2009
Springer
14 years 8 months ago
2009
Springer
Abstract. The general trend in semiconductor industry to separate design from fabrication leads to potential threats from untrusted integrated circuit foundries. In particular, mal...
SAC
2005
ACM
14 years 1 months ago
2005
ACM
In recent years, exciting technological advances have been made in development of flexible electronics. These technologies offer the opportunity to weave computation, communicat...
DAC
2003
ACM
14 years 8 months ago
2003
ACM
Software-based self-test (SBST) is an emerging approach to address the challenges of high-quality, at-speed test for complex programmable processors and systems-on chips (SoCs) th...
DFT
1997
IEEE
13 years 12 months ago
1997
IEEE
Abstract— Error control is a major concern in many computer systems, particularly those deployed in critical applications. Experience shows that most malfunctions during system o...
CDC
2009
IEEE
13 years 8 months ago
2009
IEEE
Classification problems in critical applications such as health care or security often require very high reliability because of the high costs of errors. In order to achieve this r...