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JWSR
2007
114views more  JWSR 2007»
13 years 7 months ago
Development of Distance Measures for Process Mining, Discovery and Integration
: Business processes continue to play an important role in today’s service-oriented enterprise computing systems. Mining, discovering, and integrating process-oriented services h...
Joonsoo Bae, Ling Liu, James Caverlee, Liang-Jie Z...
ISCA
2007
IEEE
106views Hardware» more  ISCA 2007»
14 years 1 months ago
Architectural implications of brick and mortar silicon manufacturing
We introduce a novel chip fabrication technique called “brick and mortar”, in which chips are made from small, pre-fabricated ASIC bricks and bonded in a designer-specified a...
Martha Mercaldi Kim, Mojtaba Mehrara, Mark Oskin, ...
IOLTS
2003
IEEE
124views Hardware» more  IOLTS 2003»
14 years 25 days ago
The positive effect on IC yield of embedded Fault Tolerance for SEUs
Fault tolerant design is a technique emerging in Integrated Circuits (IC’s) to deal with the increasing error susceptibility (Soft Errors, or Single Event Upsets, SEU) caused by...
André K. Nieuwland, Richard P. Kleihorst
DATE
2006
IEEE
95views Hardware» more  DATE 2006»
14 years 1 months ago
An effective technique for minimizing the cost of processor software-based diagnosis in SoCs
The ever increasing usage of microprocessor devices is sustained by a high volume production that in turn requires a high production yield, backed by a controlled process. Fault d...
Paolo Bernardi, Ernesto Sánchez, Massimilia...
ISPW
2008
IEEE
14 years 1 months ago
Integrating Joint Reviews with Automotive SPICE Assessments Results
The continuous changes in customer requirements as well as the ever-increasing market-driven demand of innovation makes automotive software projects success strongly dependent on t...
Fabrizio Fabbrini, Mario Fusani, Giuseppe Lami, Ed...