1727 search results - page 201 / 346 » An Integrated Approach to Manufacturing Process Design and C... |
154
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ISQED
2007
IEEE
16 years 5 days ago
2007
IEEE
Parameter variation in integrated circuits causes sections of a chip to be slower than others. To prevent any resulting timing errors, designers have traditionally designed for th...
137
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DAC
1996
ACM
15 years 10 months ago
1996
ACM
Abstract: Exploration at the earliest stages of the design process is an integral component of effective low-power design. Nevertheless, superficial high-level analyses with insuff...
177
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WWW
2007
ACM
16 years 6 months ago
2007
ACM
This paper reports a safe regression test selection (RTS) approach that is designed for verifying Web services in an end-to-end manner. The Safe RTS technique has been integrated ...
135
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GECCO
2003
Springer
15 years 11 months ago
2003
Springer
Power consumption and portability issues are becoming increasingly significant in embedded system architectures. Therefore, it is important that chip architects and integrated circ...
176
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AUSFORENSICS
2003
15 years 7 months ago
2003
The increase in cyber-crime has created the need for security technologies that are always one step ahead of the criminal. Computer forensics and incident response solutions allow...