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JCP
2008
13 years 7 months ago
2008
Semiconductor manufacturing process scaling increases leakage and transistor variations, both of which are problematic for static random access memory (SRAM). Since SRAM is a criti...
DSVIS
1998
Springer
13 years 11 months ago
1998
Springer
Formal modelling, in interactive system design, has received considerably less real use than might have been hoped. Heavy weight formal methods can be expensive to use, with poor c...
MICRO
2008
IEEE
14 years 2 months ago
2008
IEEE
— As semiconductor processing techniques continue to scale down, transient faults, also known as soft errors, are increasingly becoming a reliability threat to high-performance m...
EWC
2000
13 years 7 months ago
2000
The complexity of modern products and design tools has made the exchange of design information more complex. It is widely recognised that the seamless capture, storage, and retriev...
ENGL
2008
13 years 7 months ago
2008
Transmission error in gearing system is a critical index for product quality. Gears with appropriate tooth modification can always behave well in transmission error, i.e. the doubl...