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DATE
2007
IEEE
14 years 3 months ago
2007
IEEE
- The intrinsic capability brought by each new technology node opens the way to a broad range of system integration options and continuously enables new applications to be integrat...
ESE
2002
13 years 8 months ago
2002
Software inspection is one of the key enablers for quality improvement and defect cost reduction. Although its benefits are shown in many studies, a major obstacle to implement an...
TASE
2011
IEEE
13 years 3 months ago
2011
IEEE
—In this paper, we present a new sketch-based system — KnitSketch, to improve the efficiency of process planning for knitting garments at an early design stage. The KnitSketch...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 6 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
FDL
2004
IEEE
14 years 21 days ago
2004
IEEE
This paper proposes a formal verification methodology which is smoothly integrated with component-based system-level design, using a divide and conquer approach. The methodology a...