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CSB
2003
IEEE
14 years 22 days ago
Group Testing With DNA Chips: Generating Designs and Decoding Experiments
DNA microarrays are a valuable tool for massively parallel DNA-DNA hybridization experiments. Currently, most applications rely on the existence of sequence-specific oligonucleot...
Alexander Schliep, David C. Torney, Sven Rahmann
DATE
2000
IEEE
121views Hardware» more  DATE 2000»
13 years 12 months ago
Functional Test Generation for Full Scan Circuits
We study the effectiveness of functional tests for full scan circuits. Functional tests are important for design validation, and they potentially have a high defect coverage indep...
Irith Pomeranz, Sudhakar M. Reddy
TAP
2010
Springer
126views Hardware» more  TAP 2010»
14 years 15 days ago
DyGen: Automatic Generation of High-Coverage Tests via Mining Gigabytes of Dynamic Traces
Unit tests of object-oriented code exercise particular sequences of method calls. A key problem when automatically generating unit tests that achieve high structural code coverage ...
Suresh Thummalapenta, Jonathan de Halleux, Nikolai...
KBSE
2010
IEEE
13 years 5 months ago
MiTV: multiple-implementation testing of user-input validators for web applications
User-input validators play an essential role in guarding a web application against application-level attacks. Hence, the security of the web application can be compromised by defe...
Kunal Taneja, Nuo Li, Madhuri R. Marri, Tao Xie, N...
SEKE
2005
Springer
14 years 28 days ago
A State-Based Approach to Testing Aspect-Oriented Programs
This paper presents a state-based approach to testing aspect-oriented programs. Aspectual state models, as an extension to the testable FREE state model of classes, are exploited ...
Dianxiang Xu, Weifeng Xu, Kendall E. Nygard