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ISMVL
2005
IEEE
90views Hardware» more  ISMVL 2005»
14 years 2 months ago
Test Generation and Fault Localization for Quantum Circuits
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...
Marek A. Perkowski, Jacob Biamonte, Martin Lukac
IPPS
1998
IEEE
14 years 1 months ago
Affordable Fault Tolerance Through Adaptation
Fault-tolerant programs are typically not only difficult to implement but also incur extra costs in terms of performance or resource consumption. Failures are typically relatively ...
Ilwoo Chang, Matti A. Hiltunen, Richard D. Schlich...
DATE
2005
IEEE
115views Hardware» more  DATE 2005»
14 years 2 months ago
Functional Coverage Driven Test Generation for Validation of Pipelined Processors
Functional verification of microprocessors is one of the most complex and expensive tasks in the current system-on-chip design process. A significant bottleneck in the validatio...
Prabhat Mishra, Nikil D. Dutt
ERSHOV
1993
Springer
14 years 27 days ago
Formal Derivation of an Error-Detecting Distributed Data Scheduler Using Changeling
Distributed database applications are a wide use of distributed systems. One of the major advantages of distributed database systems is the potential for achieving high availabili...
Hanan Lutfiyya, Bruce M. McMillin, Alan Su 0002
SOCO
2010
Springer
13 years 7 months ago
Automatic detection of trends in time-stamped sequences: an evolutionary approach
This paper presents an evolutionary algorithm for modeling the arrival dates in time-stamped data sequences such as newscasts, e-mails, IRC conversations, scientific journal artic...
Lourdes Araujo, Juan Julián Merelo Guerv&oa...