140 search results - page 5 / 28 » An Interval Intelligent-based Approach for Fault Detection a... |
VTS
1996
IEEE
14 years 28 days ago
1996
IEEE
In this paper we investigate optimal voltage testing approaches for physically-based faults in CMOS circuits. We describe the general nature of the problem and then focus on two f...
ETS
2006
IEEE
14 years 2 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
CDC
2009
IEEE
14 years 3 days ago
2009
IEEE
— In this paper, a new method to design an observer for nonlinear systems described by Takagi-Sugeno (TS) model, with unmeasurable premise variables, is proposed. Most of existin...
DATE
2004
IEEE
14 years 16 days ago
2004
IEEE
Noise affects circuit operation by increasing gate delays and causing latches to capture incorrect values. Noise analysis techniques can detect some of such noise faults, but accu...
DSN
2004
IEEE
14 years 16 days ago
2004
IEEE
Recent developments in the field of object-based fault tolerance and the advent of the first OMG FTCORBA compliant middleware raise new requirements for the design process of dist...