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ASPDAC
2004
ACM
102views Hardware» more  ASPDAC 2004»
14 years 2 months ago
TranGen: a SAT-based ATPG for path-oriented transition faults
— This paper presents a SAT-based ATPG tool targeting on a path-oriented transition fault model. Under this fault model, a transition fault is detected through the longest sensit...
Kai Yang, Kwang-Ting Cheng, Li-C. Wang
SIGGRAPH
1993
ACM
14 years 26 days ago
Interval methods for multi-point collisions between time-dependent curved surfaces
We present an efficient and robust algorithm for finding points of collision between time-dependent parametric and implicit surfaces. The algorithm detects simultaneous collisio...
John M. Snyder, Adam R. Woodbury, Kurt W. Fleische...
DATE
2007
IEEE
155views Hardware» more  DATE 2007»
14 years 3 months ago
Design fault directed test generation for microprocessor validation
Functional validation of modern microprocessors is an important and complex problem. One of the problems in functional validation is the generation of test cases that has higher p...
Deepak Mathaikutty, Sandeep K. Shukla, Sreekumar V...
AAAI
2000
13 years 10 months ago
Bayesian Fault Detection and Diagnosis in Dynamic Systems
This paper addresses the problem of tracking and diagnosing complex systems with mixtures of discrete and continuous variables. This problem is a difficult one, particularly when ...
Uri Lerner, Ronald Parr, Daphne Koller, Gautam Bis...
MTDT
2000
IEEE
137views Hardware» more  MTDT 2000»
14 years 1 months ago
Diagnostic Testing of Embedded Memories Based on Output Tracing
A new approach to diagnostic testing of embedded memories is presented which enables the design of tests that provide complete detection and distinguishing of all faults in a give...
Dirk Niggemeyer, Elizabeth M. Rudnick, Michael Red...