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ICSE
2007
IEEE-ACM
14 years 7 months ago
Using GUI Run-Time State as Feedback to Generate Test Cases
This paper presents a new automated model-driven technique to generate test cases by using feedback from the execution of a "seed test suite" on an application under tes...
Xun Yuan, Atif M. Memon
KBSE
1998
IEEE
13 years 11 months ago
Automated Software Test Data Generation for Complex Programs
We report on GADGET, a new software test generation system that uses combinatorial optimization to obtain condition/decision coverage of C/C++ programs. The GADGET system is fully...
Christoph C. Michael, Gary McGraw
TC
1998
13 years 7 months ago
Abstraction Techniques for Validation Coverage Analysis and Test Generation
ion Techniques for Validation Coverage Analysis and Test Generation Dinos Moundanos, Jacob A. Abraham, Fellow, IEEE, and Yatin V. Hoskote —The enormous state spaces which must be...
Dinos Moundanos, Jacob A. Abraham, Yatin Vasant Ho...
ISVLSI
2007
IEEE
181views VLSI» more  ISVLSI 2007»
14 years 1 months ago
Code-coverage Based Test Vector Generation for SystemC Designs
Abstract— Time-to-Market plays a central role on System-ona-Chip (SoC) competitiveness and the quality of the final product is a matter of concern as well. As SoCs complexity in...
Alair Dias Jr., Diógenes Cecilio da Silva J...
EUROGP
2001
Springer
124views Optimization» more  EUROGP 2001»
14 years 1 days ago
An Evolutionary Approach to Automatic Generation of VHDL Code for Low-Power Digital Filters
An evolutionary algorithm is used to design a finite impulse response digital filter with reduced power consumption. The proposed design approach combines genetic optimization an...
Massimiliano Erba, Roberto Rossi, Valentino Libera...