35 search results - page 6 / 7 » An analytical model for negative bias temperature instabilit... |
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
Abstract—Reliable and verifiable hardware, software and content usage metering (HSCM) are of primary importance for wide segments of e-commerce including intellectual property a...
DAC
2007
ACM
14 years 8 months ago
2007
ACM
This paper presents a variation resilient circuit design technique for maintaining parametric yield of design under inherent variation in process parameters. We propose to utilize...
VLSID
2007
IEEE
14 years 8 months ago
2007
IEEE
Device scaling such as reduced oxide thickness and high electric field has given rise to various reliability concerns. One such growing issue of concern is the degradation of PMOS...
ISPD
2010
ACM
14 years 2 months ago
2010
ACM
NBTI (Negative Bias Temperature Instability) has emerged as the dominant failure mechanism for PMOS in nanometer IC designs. However, its impact on one of the most important compo...
DATE
2009
IEEE
14 years 2 months ago
2009
IEEE
—Negative Bias Temperature Instability (NBTI) is a significant reliability concern for nanoscale CMOS circuits. Its effects on circuit timing can be especially pronounced for ci...