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EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
15 years 9 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero
VTS
1995
IEEE
94views Hardware» more  VTS 1995»
15 years 8 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
PROCEDIA
2010
103views more  PROCEDIA 2010»
14 years 11 months ago
Towards generating optimised finite element solvers for GPUs from high-level specifications
We argue that producing maintainable high-performance implementations of finite element methods for multiple targets requires that they are written using a high-level domain-speci...
Graham R. Markall, David A. Ham, Paul H. J. Kelly
GECCO
2005
Springer
121views Optimization» more  GECCO 2005»
15 years 10 months ago
New evolutionary techniques for test-program generation for complex microprocessor cores
Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when cons...
Ernesto Sánchez, Massimiliano Schillaci, Ma...
VISUALIZATION
1996
IEEE
15 years 8 months ago
Generation of Transfer Functions with Stochastic Search Techniques
This paper presents a novel approach to assist the user in exploring appropriate transfer functions for the visualization of volumetric datasets. The search for a transfer functio...
Taosong He, Lichan Hong, Arie E. Kaufman, Hanspete...