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EUROGP
2003
Springer
101views Optimization» more  EUROGP 2003»
14 years 1 months ago
An Enhanced Framework for Microprocessor Test-Program Generation
Test programs are fragment of code, but, unlike ordinary application programs, they are not intended to solve a problem, nor to calculate a function. Instead, they are supposed to ...
Fulvio Corno, Giovanni Squillero
VTS
1995
IEEE
94views Hardware» more  VTS 1995»
13 years 11 months ago
Synthesis of locally exhaustive test pattern generators
Optimized locally exhaustive test pattern generators based on linear sums promise a low overhead, but have an irregular structure. The paper presents a new algorithm able to compu...
Günter Kemnitz
PROCEDIA
2010
103views more  PROCEDIA 2010»
13 years 3 months ago
Towards generating optimised finite element solvers for GPUs from high-level specifications
We argue that producing maintainable high-performance implementations of finite element methods for multiple targets requires that they are written using a high-level domain-speci...
Graham R. Markall, David A. Ham, Paul H. J. Kelly
GECCO
2005
Springer
121views Optimization» more  GECCO 2005»
14 years 1 months ago
New evolutionary techniques for test-program generation for complex microprocessor cores
Checking if microprocessor cores are fully functional at the end of the productive process has become a major issue. Traditional functional approaches are not sufficient when cons...
Ernesto Sánchez, Massimiliano Schillaci, Ma...
VISUALIZATION
1996
IEEE
14 years 11 days ago
Generation of Transfer Functions with Stochastic Search Techniques
This paper presents a novel approach to assist the user in exploring appropriate transfer functions for the visualization of volumetric datasets. The search for a transfer functio...
Taosong He, Lichan Hong, Arie E. Kaufman, Hanspete...